SAM-DENEB Scanning Acoustic Microscope for Semiconductor and Industrial Materials. Kind :   SAM Products

¡Ý Semiconductor : Flip Chip, BGA, QFT, TBGA, FBGA, SOP, FET, MLCC, PCB ¡Ý Industrial : ITO Target, Wafer, Pipe, Plate, Bar, complex Material, Piston test, Flaw detection in Planting, Car Engine, Weld zone ¡Ý The basic standard type SAM eqipment ¡Ý Measure the thickness of materials ¡Ý Measure the location and the size of flaw(Debonding, Delamination, Crack) inside materials and on the surface ¡Ý Low noise by using the highly efficient linear-servo motor ¡Ý High quality and accurate scanning image ¡Ý A, C, T Scan   1. Ultrasonic Pulser/Receiver Frequency Range : 1 - 500MHz Low noise, high performance pulser/receiver derives the ultrasonic signal of ultra wide-bandwidth characteristics from the transducer.   2. A/D Converter Real time 2GHz Sampling Rate , 1GHz Bandwidth   3. Mechanical Scanner Scan Axis (Linear servo motor) Max. Stroke 350mm Max. Speed 1,000mm/s Repeatability +/-0.5 micron Encoder Resolution 0.5micron Index Axis Micro-stepping motor with lead screw Max. Stroke 350mm Step Resolution 0.5micron Vertical Axis Micro-stepping motor with lead screw Max. Stroke 70mm Vertical Resolution 2.5micron   4. General Water circulation pump with filter Immersion Tank Dimension 500mm x 520mm x 100mm C- Scanning Area with T-Scan 350mm X 350mm X 70mm Main Unit SIZE 950mm X 900mm X 1350mm Weight Approx. 250kg Power AC220V / 20A