SAM-DENEB
Scanning Acoustic Microscope for Semiconductor and Industrial Materials.
Kind :   SAM Products



¡Ý Semiconductor : Flip Chip, BGA, QFT, TBGA, FBGA, SOP, FET, MLCC, PCB
¡Ý 
Industrial : ITO Target, Wafer, Pipe, Plate, Bar, complex Material, Piston test, Flaw detection in Planting, Car Engine, Weld zone





¡Ý The basic standard type SAM eqipment
¡Ý Measure the thickness of materials
¡Ý Measure the location and the size of flaw(Debonding, Delamination, Crack) inside materials and on the surface
¡Ý Low noise by using the highly efficient linear-servo motor
¡Ý High quality and accurate scanning image
¡Ý A, C, T Scan




 
1. Ultrasonic Pulser/Receiver
Frequency Range : 1 - 500MHz
Low noise, high performance pulser/receiver derives the ultrasonic signal of ultra wide-bandwidth characteristics from the transducer.

 

2. A/D Converter
Real time 1GHz(8Bit) or 1.8GHz(12Bit)

 

3. Mechanical Scanner
Scan Axis (Linear servo motor) Max. Stroke 350mm Max. Speed 1,000mm/s Repeatability +/-0.5 micron Encoder Resolution 0.5micron
Index Axis Micro-stepping motor with lead screw Max. Stroke 350mm Step Resolution 0.5micron
Vertical Axis Micro-stepping motor with lead screw Max. Stroke 70mm Vertical Resolution 2.5micron

 

4. General
Water circulation pump with filter
Immersion Tank Dimension 500mm x 520mm x 100mm
C- Scanning Area with T-Scan C-Scan 350mm X 350mm X 80mm
T-Scan 350mm X 130mm X 80mm
Main Unit SIZE 970mm X 900mm X 1350mm
Weight Approx. 350kg
Power AC220V / 20A
 
 

 

 
Copyright ¨Ï2012 ACOULAB.CO., LTD. All Rights Resrved. TEL.032-676-8077~8 FAX.032-676-8079
8, Sudo-ro 55beon-gil, Bucheon-si, Gyeonggi-do, 14516, KOREA
Representative : Lee WonHeum   Email : sales@acoulab.co.kr